COURSE DESCRIPTIONS
ECE 6202 PROBABILISTIC METHODS OF SYSTEM ANALYSIS
Random Processes: Continuous and Discrete Random Processes,
Deterministic and Nondeterministic Random Processes,
Stationary and Nonstationary Random Processes, Ergodic and
Nonergodic Random Processes, Measurement of Process
Parameters; Correlation Functions: Autocorrelation Function
of a binary Process, Properties of Autocorrelation
Functions, Measurement of Autocorrelation Functions,
Examples of Autocorrelation Functions, Cross-correlation
Functions, Properties of Cross-correlation Functions,
Examples and Applications of Cross-correlation Functions;
Spectral Density: Relation of Spectral Density to the
Fourier Transform, Properties of Spectral Density, Spectral
Density and the Complex Frequency Plane, Mean-Square Values
from Spectral Density, Relation of Spectral Density to the
Autocorrelation Function, White Noise, Cross-spectral
Density, Measurement of Spectral Density, Examples and
Applications of Spectral Density; Response of Linear Systems
to Random Inputs: Analysis in the Time Domain, Mean and Mean
Square Value of System Output, Autocorrelation Function of
System Output, Cross-correlation Between Input and Output,
Example of Time-Domain System Analysis, Analysis in
Frequency Domain, Spectral Density at the System Output,
Cross-Spectral Densities Between Input and Output, Examples
of Frequency Domain Analysis; Optimum Linear Systems:
Criteria of Optimality, Restriction on the Optimum System,
Optimization by Parameter Adjustment, Systems Maximize
Signal-to-Noise Ratio, Systems that Minimize Mean-Square
Error.
ECE 6203 ANALYSIS OF STRIP AND MICROSTRIP SYSTEMS
Microwave integrated circuits: Circuit forms for microwave
integrated circuits/ The technology of microwave integrated
circuits: Monolithic technology. Hybrid technology.
Comparison between monolithic and hybrid circuits.
Properties of high resistivity semiconducting substrates.
Substrates for hybrid circuits. Deposed metals for MICs
(thin-film technology). Fired film metallization (thick-film
technology). Fired vs. deposed films in MICs. Other film
materials. Circuit requirements and fabrication.
Characterization and incorporation of active devices in
MICs/ Analysis of microstrip transmission lines: Quasi-TEM
analysis for microstrip line structure. Wave theory analysis
of microstrip lines. Higher order modes. Losses in
microstrip lines. Radiation and end loading. Conclusions/
Lumped elements in microwave integrated circuits:
Lumped-element design. Design of inductors and resistors.
Design of capacitors. The measurement and performance of
lumped elements of 12 GHz. Lumped-element circuits. Status
of lumped-element applications/ Integrated ferromagnetic
devices: Electromagnetic wave propagation in bounded media.
Integrated ferrite phase shifters. Circulators. Edge guided
devices/ Microwave propagation on coupled pairs of
microstrip transmission lines: The coupled microstrip
configuration. Normal modes of propagation in the Quasi-TEM
regime. Presentations of data/ Computer aided design,
simulation and optimization: Analysis of microwave circuits.
Analytical characterization of cascaded distributed
elements. Performance simulation techniques. Fundamentals of
optimization. Description and application of DEMON
(diminishing error method of optimization for networks).
ECE 6204 ANALYSIS OF MICROSTRIP ANTENNAS
Basic concepts and calculation techniques: Aperture
antennas, Patch antennas. Radiation characteristics. Planar,
circular, spherical structures. Arbitrary patch
configurations. Patch trajectories for specific purposes.
Embedded structures. Microstrip arrays.
ECE 6205 FIRST ORDER CANONICAL PROBLEMS OF DIFFRACTION
The phenomenon of diffraction. The diffraction of
electromagnetic waves from regions of small refrangeability.
The Jeffreys (W.K.B.) approximation. Radio wave propagation:
explanation of the problem and the historical background;
the extension of Watson's analysis for a nonhomogeneous
atmosphere; high level inversions. The diffraction of
electrically polarized waves around a finite, perfectly
conducting cone. Diffraction by large and small cones.
Linear integral equations. The simple microwave lens.
Diffraction from objects in the focal field: the slab; the
cylinder. The Fabry-Perot microwave interferometer: basic
theory. The concentric resonator. The ex-centric resonator.
The driven microwave interferometer.
ECE 6206 MIXED BOUNDARY VALUE PROBLEMS IN ELECTROMAGNETIC
THEORY
Mixed boundary value problems; basic elementary problems;
generalized potential theory; Integrals and series including
Bessel functions; Integral equations; Hankel transforms and
associated Legendre Functions; the first basic problem:
electrically charged disc problem; Weber solution; Beltrami
symmetric potentials; the formulation and solution of the
problem in oblate spherical coordinates; Corpon solution;
Beltrami method, elementary solution of dual integral
equations; Methods based on integral representation of
harmonic functions; dual integral equations: dual integral
equations in Titchmarsh type; Peter solution; Titchmarsh
solution; Nöble solution; Gordon-Copson solution; Functions
derived from solutions of dual integral equations; special
cases; Hankel kernel; arbitrary weight function; general
problem; Integral representation methods; approximate
solutions; simultaneous equations; dual series equations
